Construction of a combined synchrotron radiation based simultaneous X-ray measurement system for simulated waste glass samples

Okamoto, Yoshihiro; Tanida, Hajime; Nagai, Takayuki

no journal, , 

We have used micro XAFS technique with a synchrotron radiation beam focused to 1 m for the analysis of simulated waste glass samples. It has been applied to the analysis of molybdate aggregates deposited in the glass sample. Simultaneous X-ray fluorescence (XRF) measurements are performed to determine what elements are present in the micro XAFS measurement area. By adding X-ray diffraction measurements using a flat panel sensor to these measurements, we plan to construct a combined XAFS-XRF-XRD analysis system. These combinations allow XAFS measurements to be performed while analyzing elemental composition and crystal form.